Case Study: Defect Detection in Gold Evaporation

Currently, integrated circuits–the microelectronic devices or components–are moving toward high speed, small size, and narrow pitch. An integrated circuit usually uses a certain process to interconnect components and wirings such as transistors, diodes, resistors, capacitors, and inductors required in a circuit; and these components are fabricated on one or several tiny semiconductor wafers or dielectricContinue reading “Case Study: Defect Detection in Gold Evaporation”

Design a site like this with WordPress.com
Get started